To goal of this project is to more fully understand the ways that electrostatic discharge (ESD) transients couple to and propagate in computer peripherals such as mice and keyboards. Several existing designs are being tested and modeled. The results of this project should allow computer industry manufacturers to design peripherals that are more immune to ESD at a lower cost than present designs.

Using the Dito ESD simulator to test the ESD susceptibility

Different ESD simulators have different ESD susceptibility (failure level) to the same equipment at the same point and position even if all the ESD generator (simulator) per IEC61000-4-2, that is the peak current is 3.75A/kV(±10%), rise time (0.7~1ns), I_30ns=2A/kV(±30%) and I_60ns=1A/kV(±30%) . Some ESD generators may just only 1kV to make the equipment failure and other ESD generators may even 6kV to make the same equipment to failure.

Why? What makes all the results so variable many times?

How to get the repeatability and compatibility results from different ESD  simulator?

Can we get the repeatable and compatible result from  same ESD simulator discharge the same equipment?

Can the ESD simulator simulate the real ESD ?

How to design or modify the EUT (equipment under test)  more robust to ESD immunity test (such as IEC61000-4-2)

All those answers  will be found at the ESD TEST REPORT

• ECE department of UMR. MO
• Dr. Huang's part photos as a visiting scholar in UMR
• Test the ESD Susceptibility of Computer
• Test the ESD Susceptibility of Computer Peripherals
• Making High voltage (35kV) TLP

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